Film Layer Analysis
By using various microscopy techniques our scientists provide critical and relevant Film Layer Analysis.
By using various microscopy techniques our scientists provide critical and relevant Film Layer Analysis.
Film technology is extremely complex and is an area of interest in the industrial, packaging, medical, and food industries. Films are often composed of several layers where each layer provides a unique property, such as a gas barrier, adhesion, chemical resistance, and oxidation resistance. The combination of the various layers form a functional product.
Important reasons for conducting Film Layer Analysis include: determining the thickness of film layers, competitor comparisons, determining the elemental composition of defects in films, and determining the elemental composition of each film layer.
Scanning Electron Microscopy with Energy Dispersive Spectroscopy (SEM-EDS) is typically used for film layer analysis.
Optical Microscopy (OM) is another excellent analytical technique for film layer analysis.
The film sample is typically fixated and cross-sectioned.
The required thickness of the film sample is usually below 2 millimeters for SEM analysis. However, thicker films can still be analyzed.
If SEM is the method used for analysis there are limitations on the volatile content of samples because excessive off-gasing can be detrimental to instrument performance.
Please contact us to talk through your specific sample considerations and Film Layer Analysis needs.
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